Design and Experiment of NIR Wheat Quality Quick Detection System

In this paper, NIR wheat quality quick detection system (NIR-WQDS) was developed on the base of grating technology with a scanning range of 900-1700nm.46 wheat samples were analyzed to compare performance of NIR-WQDS and MPA FT-NIR spectroscopy (MPA). Experiment results of NIR-WQDS show that the coefficient of determination R is 94.44%, root mean square error of cross validation RMSECV is 0.3460, ratio of performance to standard deviate RPD is 4.240, and root mean square error of prediction RMSEP is 0.2430, respectively. The model of MPA spectroscopy gave an R of 95.95%, a RMSECV of 0.2950, a RPD of 4.970, and an RMSEP of 0.2270 respectively. It is found that spectra of NIR-WQDS have a roughly same changing trend. NIR-WQDS can detect wheat quality with good accuracy, repeatability and stability, which is similar to MPA. The results show that NIR-WQDS can work steadily with a good performance.